![](/img/cover-not-exists.png)
[IEEE IECON 2017 - 43rd Annual Conference of the IEEE Industrial Electronics Society - Beijing (2017.10.29-2017.11.1)] IECON 2017 - 43rd Annual Conference of the IEEE Industrial Electronics Society - Study of the adaptation of a concavo-convex sheet for a peach fruit inspection system
Makino, Koji, Ishida, Kazuyoshi, Watanabe, Hiromi, Suzuki, Yutaka, Kotani, Shinji, Terada, HidetsuguYear:
2017
Language:
english
DOI:
10.1109/iecon.2017.8217497
File:
PDF, 600 KB
english, 2017