[IEEE 2017 IEEE 24th International Symposium on the...

  • Main
  • [IEEE 2017 IEEE 24th International...

[IEEE 2017 IEEE 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Chengdu, China (2017.7.4-2017.7.7)] 2017 IEEE 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - The segmented SCRs with optimized holding voltage for on-chip ESD protection

Huang, Xiaozong, Liu, Zhiwei, Liu, Fan, Liu, Jizhi, Huang, Wengang, Song, Wenqiang, Ma, Chenyue, Lin, Xinnan
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
2017
Language:
english
DOI:
10.1109/ipfa.2017.8060210
File:
PDF, 344 KB
english, 2017
Conversion to is in progress
Conversion to is failed