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[IEEE 2017 IEEE 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Chengdu, China (2017.7.4-2017.7.7)] 2017 IEEE 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - The segmented SCRs with optimized holding voltage for on-chip ESD protection
Huang, Xiaozong, Liu, Zhiwei, Liu, Fan, Liu, Jizhi, Huang, Wengang, Song, Wenqiang, Ma, Chenyue, Lin, XinnanYear:
2017
Language:
english
DOI:
10.1109/ipfa.2017.8060210
File:
PDF, 344 KB
english, 2017