[IEEE 2017 IEEE International Symposium on Circuits and Systems (ISCAS) - Baltimore, MD, USA (2017.5.28-2017.5.31)] 2017 IEEE International Symposium on Circuits and Systems (ISCAS) - A guide to graceful aging: How not to overindulge in post-silicon burn-in for enhancing reliability of weak PUF
Islam, Md Nazmul, Patil, Vinay C., Kundu, SandipYear:
2017
Language:
english
DOI:
10.1109/iscas.2017.8050881
File:
PDF, 252 KB
english, 2017