[IEEE IEEE 1976 International Symposium on Electromagnetic...

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[IEEE IEEE 1976 International Symposium on Electromagnetic Compatibility - Washington, D.C. (1976.7.13-1976.7.15)] IEEE 1976 International Symposium on Electromagnetic Compatibility - Properties of Wideband Magnetic Field Probes

Babij, Tadeusz M., Trzaska, Hubert
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Year:
1976
Language:
english
DOI:
10.1109/isemc.1976.7568758
File:
PDF, 670 KB
english, 1976
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