[IEEE 2017 IEEE 17th International Conference on Nanotechnology (IEEE-NANO) - Pittsburgh, PA, USA (2017.7.25-2017.7.28)] 2017 IEEE 17th International Conference on Nanotechnology (IEEE-NANO) - On the secondary electron emission phenomenon when originating from very thin layers
Makasheva, K., Belhaj, M., Teyssedre, G., Rigoudy, C., Dadouch, S., Boudou, L.Year:
2017
Language:
english
DOI:
10.1109/nano.2017.8117275
File:
PDF, 276 KB
english, 2017