[IEEE 2017 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S) - Burlingame, CA (2017.10.16-2017.10.19)] 2017 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S) - Time-dependent Vth shift of silicon on thin BOX under large back bias
Yamamoto, Yoshiki, Makiyama, Hideki, Hasegawa, Takumi, Okanishi, Shinobu, Maekawa, Keiichi, Shinkawata, Hiroki, Yamaguchi, YasuoYear:
2017
Language:
english
DOI:
10.1109/s3s.2017.8308738
File:
PDF, 1.30 MB
english, 2017