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[IEEE 2017 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S) - Burlingame, CA (2017.10.16-2017.10.19)] 2017 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S) - Gate-induced vs. implanted body doping impact on Z 2 -FET DC operation
Navarro, C., Gamiz, F., Rodriguez, N., Donetti, L., Sampedro, C., Kim, Seong Il, Kim, Yong Tae, Cristoloveanu, S.Рік:
2017
Мова:
english
DOI:
10.1109/s3s.2017.8308748
Файл:
PDF, 1.37 MB
english, 2017