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[IEEE 2017 IEEE International Ultrasonics Symposium (IUS) - Washington, DC, USA (2017.9.6-2017.9.9)] 2017 IEEE International Ultrasonics Symposium (IUS) - Next-generation ultrasound research scanners design
Tortoli, Piero, Boni, Enrico, Bassi, Luca, Dallai, Alessandro, Guidi, Francesco, Ramalli, Alessandro, Ricci, StefanoYear:
2017
Language:
english
DOI:
10.1109/ultsym.2017.8092607
File:
PDF, 54 KB
english, 2017