[IEEE 2017 29th International Symposium on Power...

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[IEEE 2017 29th International Symposium on Power Semiconductor Devices and IC's (ISPSD) - Sapporo, Japan (2017.5.28-2017.6.1)] 2017 29th International Symposium on Power Semiconductor Devices and IC's (ISPSD) - U-shaped channel SOI-LIGBT with dual trenches to improve the trade-off between saturation voltage and turn-off loss

Zhang, Long, Zhu, Jing, Sun, Weifeng, Zhao, Minna, Chen, Jiajun, Huang, Xuequan, Ding, Desheng, Gu, Yan, Zhang, Sen, Hou, Bo
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Year:
2017
DOI:
10.23919/ISPSD.2017.7988961
File:
PDF, 700 KB
2017
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