Reducing inspection time of pulse phase thermography by...

Infrared Physics & Technology 2018 / 08 Vol. 92

Reducing inspection time of pulse phase thermography by using phase data at higher frequency range

Ishikawa, Masashi, Ogasawara, Nagahisa, Yamada, Hiroyuki, Kasano, Hideyuki, Koyama, Masashi, Hatta, Hiroshi, Utsunomiya, Shin, Nishitani, Yutaka, Fukui, Ryo
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Volume:
92
Language:
english
Journal:
Infrared Physics & Technology
DOI:
10.1016/j.infrared.2018.05.008
Date:
August, 2018
File:
PDF, 528 KB
english, 2018
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