[IEEE 2018 IEEE International Reliability Physics Symposium (IRPS) - Burlingame, CA (2018.3.11-2018.3.15)] 2018 IEEE International Reliability Physics Symposium (IRPS) - Temperature and voltage effects on HTRB and HTGB stresses for AlGaN/GaN HEMTs
Chihani, Omar, Theolier, Loic, Deletage, Jean-Yves, Woirgard, Eric, Chihani, Omar, Bensoussan, Alain, Durier, AndreYear:
2018
Language:
english
DOI:
10.1109/IRPS.2018.8353685
File:
PDF, 791 KB
english, 2018