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[IEEE 2018 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS) - Granada (2018.3.19-2018.3.21)] 2018 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS) - Low-frequency noise in surface-treated AlGaN/GaN HFETs
Im, Ki-Sik, Lee, Jun-Hyeok, Lee, Jung-Hee, Theodorou, Christoforos G., Ghibaudo, Gerard, Cristoloveanu, SorinYear:
2018
Language:
english
DOI:
10.1109/ULIS.2018.8354738
File:
PDF, 266 KB
english, 2018