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Defect-Free Copolymer Gate Dielectrics for Gating MoS 2 Transistors
Kim, Min Je, Choi, Yongsuk, Seok, Jihoo, Lee, Sungjoo, Kim, Young Jun, Lee, Jun Young, Cho, Jeong HoLanguage:
english
Journal:
The Journal of Physical Chemistry C
DOI:
10.1021/acs.jpcc.8b03092
Date:
May, 2018
File:
PDF, 1.42 MB
english, 2018