A High Performance Scan Flip-Flop Design for Serial and...

IEEE Transactions on Device and Materials Reliability 2018 / 6 Vol. 18; Iss. 2

A High Performance Scan Flip-Flop Design for Serial and Mixed Mode Scan Test

Ahlawat, Satyadev, Tudu, Jaynarayan, Matrosova, Anzhela, Singh, Virendra
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Volume:
18
Language:
english
Journal:
IEEE Transactions on Device and Materials Reliability
DOI:
10.1109/TDMR.2018.2835414
Date:
June, 2018
File:
PDF, 1009 KB
english, 2018
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