[IEEE 2018 Design, Automation & Test in Europe Conference & Exhibition (DATE) - Dresden, Germany (2018.3.19-2018.3.23)] 2018 Design, Automation & Test in Europe Conference & Exhibition (DATE) - Dynamic skewed tree for fast memory integrity verification
Vig, Saru, Jiang, Guiyuan, Lam, Siew-KeiYear:
2018
Language:
english
DOI:
10.23919/DATE.2018.8342089
File:
PDF, 187 KB
english, 2018