[IEEE 2018 IEEE International Reliability Physics Symposium (IRPS) - Burlingame, CA (2018.3.11-2018.3.15)] 2018 IEEE International Reliability Physics Symposium (IRPS) - Evaluation methodology for current collapse phenomenon of GaN HEMTs
Sugiyama, Toru, Oasa, Kohei, Saito, Yasunobu, Yoshioka, Akira, Kikuchi, Takuo, Shindome, Aya, Ohguro, Tatsuya, Hamamoto, TakeshiYear:
2018
Language:
english
DOI:
10.1109/IRPS.2018.8353559
File:
PDF, 829 KB
english, 2018