[Springer Proceedings in Mathematics & Statistics] Statistics and Simulation Volume 231 || An Overview on Recent Advances in Statistical Burn-In Modeling for Semiconductor Devices
Pilz, Jürgen, Rasch, Dieter, Melas, Viatcheslav B., Moder, KarlVolume:
10.1007/97
Year:
2018
Language:
english
DOI:
10.1007/978-3-319-76035-3_26
File:
PDF, 273 KB
english, 2018