Use of PROFIBUS for cryogenic instrumentation at XFEL

IOP Conference Series Materials Science and Engineering 2017 / 12 Vol. 278

Use of PROFIBUS for cryogenic instrumentation at XFEL

Boeckmann, T., Bolte, J., Bozhko, Y., Clausen, M., Escherich, K., Korth, O., Penning, J., Rickens, H., Schnautz, T., Schoeneburg, B., Zhirnov, A.
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Volume:
278
Language:
english
Journal:
IOP Conference Series: Materials Science and Engineering
DOI:
10.1088/1757-899X/278/1/012088
Date:
December, 2017
File:
PDF, 1.51 MB
english, 2017
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