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Use of PROFIBUS for cryogenic instrumentation at XFEL
Boeckmann, T., Bolte, J., Bozhko, Y., Clausen, M., Escherich, K., Korth, O., Penning, J., Rickens, H., Schnautz, T., Schoeneburg, B., Zhirnov, A.Volume:
278
Language:
english
Journal:
IOP Conference Series: Materials Science and Engineering
DOI:
10.1088/1757-899X/278/1/012088
Date:
December, 2017
File:
PDF, 1.51 MB
english, 2017