[IEEE 2018 IEEE Applied Power Electronics Conference and Exposition (APEC) - San Antonio, TX, USA (2018.3.4-2018.3.8)] 2018 IEEE Applied Power Electronics Conference and Exposition (APEC) - Developing a standardized method for measuring and quantifying dynamic on-state resistance via a survey of low voltage GaN HEMTs
Foulkes, Thomas, Modeer, Tomas, Pilawa-Podgurski, Robert C. N.Year:
2018
Language:
english
DOI:
10.1109/APEC.2018.8341401
File:
PDF, 1.57 MB
english, 2018