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ChemInform Abstract: EPITAXIAL GROWTH AND CHARACTERIZATION OF β-SILICON CARBIDE (SIC) THIN FILMS
LIAW, P., DAVIS, R. F.Volume:
16
Journal:
Chemischer Informationsdienst
DOI:
10.1002/chin.198537009
Date:
September, 1985
File:
PDF, 123 KB
1985