Oxidation mechanism of thin Cu films: A gateway towards the...

AIP Advances 2018 / 05 Vol. 8; Iss. 5

Oxidation mechanism of thin Cu films: A gateway towards the formation of single oxide phase

Choudhary, Sumita, Sarma, J. V. N., Pande, Surojit, Ababou-Girard, Soraya, Turban, Pascal, Lepine, Bruno, Gangopadhyay, Subhashis
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Volume:
8
Language:
english
Journal:
AIP Advances
DOI:
10.1063/1.5028407
Date:
May, 2018
File:
PDF, 4.00 MB
english, 2018
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