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[IEEE 2018 IEEE Applied Power Electronics Conference and Exposition (APEC) - San Antonio, TX, USA (2018.3.4-2018.3.8)] 2018 IEEE Applied Power Electronics Conference and Exposition (APEC) - Short circuit characterization of 3 rd generation 10 kV SiC MOSFET
Ji, Shiqi, Laitinen, Marko, Huang, Xingxuan, Sun, Jingjing, Giewont, Bill, Tolbert, Leon M., Wang, FredYear:
2018
Language:
english
DOI:
10.1109/APEC.2018.8341410
File:
PDF, 1.83 MB
english, 2018