[IEEE 2018 IEEE International Symposium on Circuits and...

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[IEEE 2018 IEEE International Symposium on Circuits and Systems (ISCAS) - Florence, Italy (2018.5.27-2018.5.30)] 2018 IEEE International Symposium on Circuits and Systems (ISCAS) - Investigation on the Gate Bias Voltage of BigFET in Power-rail ESD Clamp Circuit for Enhanced Transient Noise Immunity

Lu, Guangyi, Wang, Yuan, Zhang, Lizhong, Wang, Yize, Huang, Ru, Zhang, Xing
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Year:
2018
Language:
english
DOI:
10.1109/ISCAS.2018.8350905
File:
PDF, 1.36 MB
english, 2018
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