ChemInform Abstract: THE EFFECT OF SILICON WAFER...

Chemischer Informationsdienst 1974 / 12 Vol. 5; Iss. 48

ChemInform Abstract: THE EFFECT OF SILICON WAFER IMPERFECTIONS ON MINORITY CARRIER GENERATION AND DIELECTRIC BREAKDOWN IN MOS STRUCTURES

OSBURN, C. M., ORMOND, D. W.
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Volume:
5
Journal:
Chemischer Informationsdienst
DOI:
10.1002/chin.197448040
Date:
December, 1974
File:
PDF, 199 KB
1974
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