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[IEEE 2018 IEEE International Symposium on Circuits and Systems (ISCAS) - Florence, Italy (2018.5.27-2018.5.30)] 2018 IEEE International Symposium on Circuits and Systems (ISCAS) - On Securing Scan Design Through Test Vector Encryption
Vaghani, Darshit, Ahlawat, Satyadev, Tudu, Jaynarayan, Fujita, Masahiro, Singh, VirendraYear:
2018
Language:
english
DOI:
10.1109/ISCAS.2018.8351212
File:
PDF, 320 KB
english, 2018