A New Methodology for EMC Prediction of Integrated Circuits After Aging
Ghfiri, Chaimae, Boyer, Alexandre, Bensoussan, Alain, Durier, Andre, Ben Dhia, SoniaYear:
2018
Language:
english
Journal:
IEEE Transactions on Electromagnetic Compatibility
DOI:
10.1109/TEMC.2018.2819722
File:
PDF, 975 KB
english, 2018