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Oxygen stoichiometry and surface treatment effect on electromigration stability of high-TcTl2Ba2CuO6+xsuperconductor
V. V. Dyakin, V.S Yefanov, M. A. Tanatar, A. I. Akimov, A. P. ChernyakovaVolume:
4
Language:
english
Pages:
4
DOI:
10.1007/bf02649060
Date:
June, 1995
File:
PDF, 330 KB
english, 1995