Quantification of nanoscale deformations using electronic...

Optics & Laser Technology 2018 / 11 Vol. 107

Quantification of nanoscale deformations using electronic speckle pattern interferometer

Padghan, P.P., Alti, K.M.
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Volume:
107
Language:
english
Journal:
Optics & Laser Technology
DOI:
10.1016/j.optlastec.2018.05.019
Date:
November, 2018
File:
PDF, 3.32 MB
english, 2018
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