The dependence of Schottky junction (I–V) characteristics...

AIP Advances 2018 / 05 Vol. 8; Iss. 5

The dependence of Schottky junction (I–V) characteristics on the metal probe size in nano metal–semiconductor contacts

Rezeq, Moh’d, Ali, Ahmed, Patole, Shashikant P., Eledlebi, Khouloud, Dey, Ripon Kumar, Cui, Bo
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Volume:
8
Language:
english
Journal:
AIP Advances
DOI:
10.1063/1.5035400
Date:
May, 2018
File:
PDF, 2.09 MB
english, 2018
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