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ChemInform Abstract: STRUCTURAL RELIABILITY OF YTTRIA-DOPED HOT-PRESSED SILICON NITRIDE AT ELEVATED TEMPERATURES
WIEDERHORN, S. M., TIGHE, N. J.Volume:
15
Journal:
Chemischer Informationsdienst
DOI:
10.1002/chin.198412344
Date:
March, 1984
File:
PDF, 114 KB
1984