A first-principles analysis of ballistic conductance, grain boundary scattering and vertical resistance in aluminum interconnects
Zhou, Tianji, Lanzillo, Nicholas A., Bhosale, Prasad, Gall, Daniel, Quon, RogerVolume:
8
Language:
english
Journal:
AIP Advances
DOI:
10.1063/1.5027084
Date:
May, 2018
File:
PDF, 4.01 MB
english, 2018