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[IEEE 2017 International Conference On Smart Technologies For Smart Nation (SmartTechCon) - Bangalore (2017.8.17-2017.8.19)] 2017 International Conference On Smart Technologies For Smart Nation (SmartTechCon) - Distribution reliability indices calculation and utilize neural network model for radial system
Mohan, C.V, Seetharam, K., Raju, H. B. PhaniYear:
2017
Language:
english
DOI:
10.1109/SmartTechCon.2017.8358585
File:
PDF, 99 KB
english, 2017