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Thermal Properties of Power Si MOSFET by Considering Electron - Phonon Scattering Using Monte Carlo Simulation
Kibushi, Risako, Hatakeyama, Tomoyuki, Nakagawa, Shinji, Ishizuka, MasaruVolume:
8
Year:
2015
Language:
english
Journal:
Transactions of The Japan Institute of Electronics Packaging
DOI:
10.5104/jiepeng.8.55
File:
PDF, 1.64 MB
english, 2015