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X-ray interferometers as a means of super-high-precision metrology (review)
V. N. Il'in, N. A. Kobets, S. V. LeshkovVolume:
66
Language:
english
Pages:
12
DOI:
10.1007/bf02675374
Date:
July, 1999
File:
PDF, 990 KB
english, 1999