Depth Profiling of the Chemical Composition of...

The Journal of Physical Chemistry C 2018 / 05

Depth Profiling of the Chemical Composition of Free-Standing Carbon Dots Using X-ray Photoelectron Spectroscopy

Papagiannouli, Irene, Patanen, Minna, Blanchet, Valerie, Bozek, John D., de Anda Villa, Manuel, Huttula, Marko, Kokkonen, Esko, Lamour, Emily, Mevel, Eric, Pelimanni, Eetu, Scalabre, Antoine, Trassine
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Language:
english
Journal:
The Journal of Physical Chemistry C
DOI:
10.1021/acs.jpcc.8b03800
Date:
May, 2018
File:
PDF, 1.01 MB
english, 2018
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