Focused electron-beam-induced deposition for fabrication of...

Focused electron-beam-induced deposition for fabrication of highly durable and sensitive metallic AFM-IR probes

Qian, Wen, Sun, Shuo, Song, Jingfeng, Nguyen, Charles, Ducharme, Stephen, Turner, Joseph A
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Volume:
29
Language:
english
Journal:
Nanotechnology
DOI:
10.1088/1361-6528/aac73c
Date:
August, 2018
File:
PDF, 758 KB
english, 2018
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