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Validating a Diffuse Reflectance near Infrared Spectroscopy Method for Measuring a Coating on a Highly-Scattering Surface
Ritchie, Gary E., Ciurczak, Emil W., Flank, SharonVolume:
25
Language:
english
Journal:
NIR news
DOI:
10.1255/nirn.1491
Date:
December, 2014
File:
PDF, 344 KB
english, 2014