Analysis of Noise and Non-Linearity of I-V Characteristics...

Metrology and Measurement Systems 2013 / 01 Vol. 20; Iss. 4

Analysis of Noise and Non-Linearity of I-V Characteristics of Positive Temperature Coefficient Chip Thermistors

Sita, Zdenek, Sedlakova, Vlasta, Majzner, Jiri, Sedlak, Petr, Sikula, Josef, Grmela, Lubomir
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Volume:
20
Language:
english
Journal:
Metrology and Measurement Systems
DOI:
10.2478/mms-2013-0054
Date:
January, 2013
File:
PDF, 951 KB
english, 2013
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