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The measurement error induced by intensity scintillation for single-pass and double-pass imaging polarimetry
Yao, Benxi, Gu, Naiting, Rao, ChanghuiVolume:
170
Language:
english
Journal:
Optik
DOI:
10.1016/j.ijleo.2018.05.060
Date:
October, 2018
File:
PDF, 367 KB
english, 2018