Enhancements in full-field PIXE imaging-Large area...

Enhancements in full-field PIXE imaging-Large area elemental mapping with increased lateral resolution devoid of optics artefacts

Buchriegler, Josef, Klingner, Nico, Hanf, Daniel, Munnik, Frans, Nowak, Stanisław H., Scharf, Oliver, Ziegenrücker, René, Renno, Axel D., Borany, Johannes von
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Volume:
47
Language:
english
Journal:
X-Ray Spectrometry
DOI:
10.1002/xrs.2946
Date:
July, 2018
File:
PDF, 1.68 MB
english, 2018
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