[ACS Symposium Series] Spectroscopic Characterization of Minerals and Their Surfaces Volume 415 || Thin-Film Elemental Analyses for Precise Characterization of Minerals
Coyne, Lelia M., McKeever, Stephen W. S., Blake, David F.Volume:
10.1021/bk
Year:
1990
Language:
english
DOI:
10.1021/bk-1990-0415.ch002
File:
PDF, 2.57 MB
english, 1990