![](/img/cover-not-exists.png)
[IEEE 2018 13th International Conference on Design & Technology of Integrated Systems In Nanoscale Era (DTIS) - Taormina, Italy (2018.4.9-2018.4.12)] 2018 13th International Conference on Design & Technology of Integrated Systems In Nanoscale Era (DTIS) - An automatic approach to integration testing for critical automotive software
Sini, J., Mugoni, A., Violante, M., Quario, A., Argiri, C., Fusetti, F.Year:
2018
Language:
english
DOI:
10.1109/DTIS.2018.8368563
File:
PDF, 192 KB
english, 2018