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[IEEE 2017 IEEE International Integrated Reliability Workshop (IIRW) - South Lake Tahoe, CA, USA (2017.10.8-2017.10.12)] 2017 IEEE International Integrated Reliability Workshop (IIRW) - Reliability aspects of novel anti-ferroelectric non-volatile memories compared to hafnia based ferroelectric memories
Pesic, Milan, Schroeder, Uwe, Slesazeck, Stefan, Mikolajick, Thomas, Mikolajick, ThomasYear:
2017
Language:
english
DOI:
10.1109/IIRW.2017.8361237
File:
PDF, 857 KB
english, 2017