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High Frequency Analysis and Small-Signal Modeling of AlGaN/GaN HEMTs with SiO2/SiN Passivation
Gassoumi, Moujahed, Helali, Abdelhamid, Gassoumi, Malek, Gaquiere, Christophe, Maaref, HassenLanguage:
english
Journal:
Silicon
DOI:
10.1007/s12633-018-9767-6
Date:
June, 2018
File:
PDF, 3.58 MB
english, 2018