[IEEE 2018 IEEE 36th VLSI Test Symposium (VTS) - San Francisco, CA, USA (2018.4.22-2018.4.25)] 2018 IEEE 36th VLSI Test Symposium (VTS) - A built-in self-test technique for transmitter-only systems
Shafiee, Maryam, Kitchen, Jennifer N., Ozev, SuleYear:
2018
Language:
english
DOI:
10.1109/VTS.2018.8368636
File:
PDF, 995 KB
english, 2018