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[IEEE 2018 IEEE 36th VLSI Test Symposium (VTS) - San Francisco, CA, USA (2018.4.22-2018.4.25)] 2018 IEEE 36th VLSI Test Symposium (VTS) - Innovative practices on machine learning for emerging applications
Madkour, Kareem, Zhang, Zhaobo, Crouch, Alfred L., Levin, Peter L., Hunter, Eve, Huang, YuYear:
2018
Language:
english
DOI:
10.1109/VTS.2018.8368654
File:
PDF, 78 KB
english, 2018