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[IEEE 2018 International Workshop on Advanced Image Technology (IWAIT) - Chiang Mai, Thailand (2018.1.7-2018.1.9)] 2018 International Workshop on Advanced Image Technology (IWAIT) - A method of defect extraction for point clouds
Muraki, Yuta, Nishio, Koji, Kanaya, Takayuki, Kobori, Ken-ichiYear:
2018
Language:
english
DOI:
10.1109/IWAIT.2018.8369693
File:
PDF, 856 KB
english, 2018