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RideNN: A New Rider Optimization Algorithm-Based Neural Network for Fault Diagnosis in Analog Circuits
Binu, D., Kariyappa, B. SYear:
2018
Language:
english
Journal:
IEEE Transactions on Instrumentation and Measurement
DOI:
10.1109/TIM.2018.2836058
File:
PDF, 7.26 MB
english, 2018