On-Wafer Characterization of Silicon Transistors Up To 500...

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IEEE Transactions on Microwave Theory and Techniques 2018

On-Wafer Characterization of Silicon Transistors Up To 500 GHz and Analysis of Measurement Discontinuities Between the Frequency Bands

Fregonese, Sebastien, De Matos, Magali, Deng, Marina, Potereau, Manuel, Ayela, Cedric, Aufinger, Klaus, Zimmer, Thomas
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Year:
2018
Language:
english
Journal:
IEEE Transactions on Microwave Theory and Techniques
DOI:
10.1109/TMTT.2018.2832067
File:
PDF, 2.58 MB
english, 2018
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