Refining scan positions in Ptychography through error...

Refining scan positions in Ptychography through error minimisation and potential application of Machine Learning

Guzzi, F., Kourousias, G., Billè, F., Pugliese, R., Reis, C., Gianoncelli, A., Carrato, S.
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Volume:
13
Language:
english
Journal:
Journal of Instrumentation
DOI:
10.1088/1748-0221/13/06/C06002
Date:
June, 2018
File:
PDF, 3.03 MB
english, 2018
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